Saturday, 6 July 2013

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Huang Receives Award for Research from Cree, Inc.

Posted by Unknown at 07:56

Dr. Alex Huang 
Dr. Alex Huang

Dr. Alex Huang has been awarded $636,284 by Cree, Inc. for research on Testing, Characterization and Design Optimization of High Voltage SiC Gate Turn-off (GTO) Thyristors.

The award will run from January 5th, 2013 to September 4th, 2016.

Research Abstract: NCSU's FREEDM Systems Center will assist Cree in the testing, characterization and design optimization of future generation of high voltage gate turn-off (GTO) thyristior.


View the original article here

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